No. 6 (2007): Tekhnologiya i konstruirovanie v elektronnoi apparature

Articles

• Prediction of the threshold voltage of GaAs ion-implanted metal-semiconductor field-effect transistors

  N. B. Gorev, I. F. Kodzhespirova, E. N. Privalov

  3-5

  • PDF (Українська)
• Methods for forming specified switching states of complex multichannel systems and networks

  V. M. Nikolayenko, S. A. Berezovskiy, O. V. Nikolayenko

  6-11

  • PDF (Українська)
• Method for calculating multichannel beam switches with an input matching section

  V. I. Oborzhytskyy

  16-19

  • PDF (Українська)
• Control of a multiphase pulse DC–DC converter in boundary-discontinuous conduction mode

  Yu. A. Gunchenko

  20-25

  • PDF (Українська)
• Magnesium–air primary power source

  S. D. Korolenko, F. V. Makordey, L. D. Konovalenko, I. N. Barba, L. I. Korolenko

  26-29

  • PDF (Українська)
• Pressure transducers for cryogenic liquids

  A. A. Druzhinin, I. I. Maryamova, A. P. Kutrakov, I. V. Pavlovskyy

  30-32

  • PDF (Українська)
• Resistance change of power diodes under surge current pulses

  S. P. Pavljuk, S. M. Savitskiy, R. B. Soltys, I. Yu. Tishchenko

  33-35

  • PDF (Українська)
• Investigation of heat transfer processes in collector thermosyphons of high-density switching boards

  Yu. Ye. Nikolaenko, А. А. Tsyganskiy

  36-41

  • PDF (Українська)
• Non-contact thermal inspection of electronic computing equipment

  S. P. Panfilova, A. I. Vlasov, V. N. Gridnev, A. S. Chervinsky

  42-49

  • PDF (Українська)
• Formation of nanostructured iridium and polycluster diamond film

  A. F. Belyanin, A. F. Pal', M. I. Samoylovich, N. V. Suetin, N. N. Dzbanovskiy, V. S. Mitin, P. V. Pashchenko, M. A. Timofeev

  50-56

  • PDF (Українська)
• Optimization of carrier concentration distribution across epitaxial layer thickness

  A. V. Karimov, D. M. Yodgorova, F. A. Giyasova, R. A. Saidova, Sh. A. Haydarov

  57-61

  • PDF (Українська)
• Metrological characteristics of the luminance meter “Tensor-28”

  I. M. Fodchuk, I. V. Doktorovych, V. M. Godovaniouk, V. K. Butenko, V. G. Yuriev

  62-64

  • PDF (Українська)