Properties of double p+-InP/n-InGaAsP/n-InP heterojunctions obtained by LPE method

  • N. M. Vakiv Scientific Research Company «Electron-Carat», Lviv, Ukraine
  • S. I. Krukovskii Scientific Research Company «Electron-Carat», Lviv, Ukraine
  • A. V. Sukach V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • V. V. Tetyorkin V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • I. A. Mrykhin Scientific Research Company «Electron-Carat», Lviv, Ukraine
  • Yu. S. Mikhashchuk Scientific Research Company «Electron-Carat», Lviv, Ukraine
  • R. S. Kru­kov­skii Scientific Research Company «Electron-Carat», Lviv, Ukraine
Keywords: epitaxial heterostructures, liquid-phase epitaxy, doping, electroluminescence, photosensitivity

Abstract

The double epitaxial p+-InP/n-InGaAsP/n-InP heterostructures with coinciding electrical and metallurgical boundaries has been obtained. Such coincidence is achieved due to growing an additional buffer n-InP layer and decreasing the time for growing an emitter p+-InP layer heavily doped by zinc. Electroluminescence spectra of such structures have a smaller half-width and the infrared radiation of higher power than the structures in which the p–n-junction is formed in the InGaAsP layer. These heterostructures are designed to create efficient IR LEDs with wavelength of 1,06 mm in spectrum maximum.

Published
2012-02-28
How to Cite
Vakiv, N. M., Krukovskii, S. I., Sukach, A. V., Tetyorkin, V. V., Mrykhin, I. A., Mikhashchuk, Y. S., & Kru­kov­skiiR. S. (2012). Properties of double p+-InP/n-InGaAsP/n-InP heterojunctions obtained by LPE method. Technology and Design in Electronic Equipment, (2), 27-30. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.2.27