Modification of barrier structure on the basis of pAlGaInAs–nGaAs by consecutively connected potential barriers

  • A. V. Karimov Physical-Тechnical Institute NGO “Physics-Sun” of the Academy of Sciences of the Republic of Uzbekistan, Tashkent, Uzbekistan
  • D. M. Yodgorova Physical-Тechnical Institute NGO “Physics-Sun” of the Academy of Sciences of the Republic of Uzbekistan, Tashkent, Uzbekistan
  • F. A. Giyasova Physical-Тechnical Institute NGO “Physics-Sun” of the Academy of Sciences of the Republic of Uzbekistan, Tashkent, Uzbekistan
  • L. Kh. Zoirova Physical-Тechnical Institute NGO “Physics-Sun” of the Academy of Sciences of the Republic of Uzbekistan, Tashkent, Uzbekistan
  • O. A. Abdulhaev Physical-Тechnical Institute NGO “Physics-Sun” of the Academy of Sciences of the Republic of Uzbekistan, Tashkent, Uzbekistan
  • D. R. Juraev Bukhara State University, Uzbekistan
Keywords: single- and double-base structure, potential series-connected barriers, pAlGaInAs–nGaAs heterojunction, impurity layer, space charge layer

Abstract

The influence of sequentially connected potential barriers on the physical processes occurring in the pAlGaInAs–nGaAs heterojunction has been investigated using single- and multi-barrier structures. It has been shown that modification of the heterojunction by creating a sequentially connected barrier to the substrate and to the heterolayer leads to the transformation of the passive parasitic part of the substrate into an active one and to its modulation from both sides, while the third barrier formed towards the heterolayer prevents carrier injection into the base region and significantly reduces the capacitance of the structure. As a result, the photosensitivity of the detector increases and its spectral range expands.

Published
2009-08-30
How to Cite
Karimov, A. V., Yodgorova, D. M., Giyasova, F. A., Zoirova, L. K., Abdulhaev, O. A., & Juraev, D. R. (2009). Modification of barrier structure on the basis of pAlGaInAs–nGaAs by consecutively connected potential barriers. Technology and Design in Electronic Equipment, (4), 52-58. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2009.4.52