Regularities of degradation in light-emitting diodes

  • I. М. Vikulin Odesa National Academy of Telecommunications named after A. S. Popov, Ukraine
  • V. I. Irkha Odesa National Academy of Telecommunications named after A. S. Popov, Ukraine
  • B. V. Korobitsyn Odesa National Academy of Telecommunications named after A. S. Popov, Ukraine
  • V. E. Gorbachev Odesa National Academy of Telecommunications named after A. S. Popov, Ukraine
Keywords: light-emitting diode, degradation, conditioning, rejection

Abstract

A method is proposed for testing gallium phosphide light-emitting diodes for service life, which significantly reduces the time required to reject unreliable diodes in production. The individual service life of each diode in a given batch is determined from two measured brightness values using a reference graph constructed from the test results of a relatively small number of devices.

Published
2004-04-30
How to Cite
VikulinI. М., Irkha, V. I., Korobitsyn, B. V., & Gorbachev, V. E. (2004). Regularities of degradation in light-emitting diodes. Technology and Design in Electronic Equipment, (2), 55-56. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.55
Issue
No. 2 (2004): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2004 Vikulin I. М., Irkha V. I., Korobitsyn B. V., Gorbachev V. E.

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.