Mathematical models of thin-film resistor resistance with a size of 50 μm

  • V. G. Spirin SPA «Temp-Avia», Arzamas, Russia
Keywords: mathematical model, thin-film resistor, nominal resistance, systematic and random errors

Abstract

The main types of errors and their effect on the resistance of a thin-film resistor are discussed. Systematic errors in length and width, as well as the resistance of its electrodes, have been additionally incorporated into the model of the resistor’s nominal resistance. The application of the resulting models will enable the design of thin-film resistors with dimensions of 50 μm and smaller without changing the manufacturing process.

How to Cite
Spirin, V. G. (1). Mathematical models of thin-film resistor resistance with a size of 50 μm. Technology and Design in Electronic Equipment, (2), 14-16. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.2.14
Issue
No. 2 (2004): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2004 V. G. Spirin

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.