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No. 5–6 (2015): Tekhnologiya i konstruirovanie v elektronnoi apparature
No. 5–6 (2015): Tekhnologiya i konstruirovanie v elektronnoi apparature
ISSN 2225-5818 (Print)
ISSN 2309-9992 (Online)
Published:
2015-12-25
Full Issue
FULL ISSUE PDF (Українська)
Articles
Optimization of complex reliability indicator of wireless devices by changing their topology
B. M. Uvarov, Yu. F. Zin'kovs'kii
3-8
PDF (Українська)
Analysis of 19-inch and metric mechanical structures for electronic equipment
A. A. Yefimenko, A. P. Karlangach
9-13
PDF (Українська)
Radiometric receiving complex and ways to reduce the radiometric measurements error
A. M. Pylypenko, I. K. Sunduchkov, V. V. Chmil, V. M. Chmil, P. O. Yatsyk
14-21
PDF (Українська)
Investigation of bulk acoustic microwaves excited by an interdigital transducer
O. G. Reshotka, V. G. Hayduchok, N. M. Vakiv
22-27
PDF (Українська)
Simulating characteristics of Si/Ge tandem monolithic solar cell with Si1-xGex buffer layer
Моделирование характеристик тандемного монолитного солнечного элемента Si/Ge с буферным слоем Si1–хGeх
A. B. Gnilenko, Ju. N. Lavrich, S. V. Plaksin
28-34
PDF (Українська)
Cooling of led module by various radiators
A. M. Naumova, Yu. E. Nikolaenko, V. Yu. Kravets, V. M. Sorokin, O. S. Oliinyk
35-40
PDF (Українська)
Formation of Cu, Ag and Au nanofiims under the influence of hydrogen atoms
E. L. Zhavzharov, V. M. Matyushin
41-44
PDF (Українська)
Research on Cu2ZnSnTe4 crystals and heterojunctions based on such crystals
T. T. Kovaliuk, M. N. Solovan, A. I. Mostovyi, E. V. Maistruk, G. P. Parkhomenko, P. D. Maryanchuk
45-49
PDF (Українська)
Annealing effect on I-V characteristic of n-ZnO – p-InSe heterojunction
Z. D. Kovalyuk, V. M. Katerynchuk, Z. R. Kudrynskyi, B. V. Kushnir, V. V. Netyaga, V. V. Khomyak
50-54
PDF (Українська)
Calculation of characteristics of X-ray devices
A. N. Orobinskyi
55-63
PDF (Українська)
Analytical method for determining coordinates of the radiation source in a homogeneous medium
H. V. Velichko
64-68
PGF (Українська)
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