UDC 621.317: 621.3.08 Classification of methods for measuring current-voltage characteristics of semiconductor devices Iermolenko Ia. O. Keywords: current-voltage characteristic, semiconductor device, method of measurement, classification.
It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current-voltage characteristics of semiconductor devices. The aim of this work is to analyze existing methods for measuring current-voltage characteristics of semiconductor devices and to create the classification of these methods in order to specify the most effective solutions in terms of defined criteria. Ukraine, Alchevsk, Donbas State Technical University. |