UDC 621.382 Increase of noise immunity of photomask images binarization Shcherbakova G. Yu., Dilevsky A. A., Krylov V. N., Logvinov O. V., Plachinda O. E. Keywords: binarization, wavelet-transform, subgradient, noise immunity. An information technology for histogram analysis and a method for noise immunity binary processing of integrated and printed circuits board photo-masks image based on this technology was carryed out. This method based on the sub-gradient iterative noise stability optimization method satisfies the demands of the automated optical control of photo-masks and printed circuits in the error and noise immunity. The maximum binary processing error does not exceed 1 pixel if the signal-to-noise ratio is more than 7. Ukraine, Odessa National Polytechnic University. |