Correlation between the parameters of the spectral density of flicker noise and the features of the internal structure of the system

  • Z. A. Kolodiy Lviv Polytechnic National University, Ukraine
  • O. H. Kruk Lviv Polytechnic National University, Ukraine
  • Yu. V. Sanots’kyy Lviv Polytechnic National University, Ukraine
  • V. D. Holynskyy Lviv Polytechnic National University, Ukraine
  • A. Z. Kolodiy Lviv Polytechnic National University, Ukraine
  • P. I. Depko Lviv Polytechnic National University, Ukraine
Keywords: flicker-noise, spectral closeness of fluctuations, time of relaxation

Abstract

The results of computer modeling of the chaotic motion of elementary particles in a flat rectangle, which can be correlated with a thin-film resistor containing conduction electrons, are presented. Analysis of the spectral density of the chaotic motion shows that one of the parameters of flicker noise depends only on the number of elementary particles and the average velocity of their motion. The second parameter of flicker noise (relaxation time) depends on the features of the internal structure of the system. This can be used to predict the reliability of both individual electronic components and equipment as a whole based on the measured level of their flicker noise.

Published
2009-02-27
How to Cite
Kolodiy, Z. A., Kruk, O. H., Sanots’kyy, Y. V., Holynskyy, V. D., Kolodiy, A. Z., & Depko, P. I. (2009). Correlation between the parameters of the spectral density of flicker noise and the features of the internal structure of the system. Technology and Design in Electronic Equipment, (1), 10-14. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2009.1.10
Issue
No. 1 (2009): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2009 Kolodiy Z. A., Kruk O. H., Sanots’kyy Y. V., Holynskyy V. D., Kolodiy A. Z., Depko P. I.

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.