Mutual influence of small-dimension objects in an integrated circuit

Abstract

A method is proposed for calculating the potential of the field generated by a unit point charge in a layered medium, as well as for computing the field of a source of finite dimensions. The approaches are based on the properties of Bessel and Struve functions. Formulas for evaluating the induced interference voltage have been obtained. The results may be useful for the development of mathematical and software tools for CAD systems, as well as at the stage of preliminary studies in numerical–heuristic optimization of circuit and design solutions.