CdZnTe-based sensors for X-ray radiation measurements

  • A. V. Rybka National Science Center «Kharkiv Institute of Physics and Technology», NAS of Ukraine, Ukraine
  • A. А. Zakharchenko National Science Center «Kharkiv Institute of Physics and Technology», NAS of Ukraine, Ukraine
  • L. N. Davydov National Science Center «Kharkiv Institute of Physics and Technology», NAS of Ukraine, Ukraine
  • I. N. Shlyakhov National Science Center «Kharkiv Institute of Physics and Technology», NAS of Ukraine, Ukraine
  • A. A. Blinkin National Science Center «Kharkiv Institute of Physics and Technology», NAS of Ukraine, Ukraine
  • K. V. Kutnyi National Science Center «Kharkiv Institute of Physics and Technology», NAS of Ukraine, Ukraine
Keywords: X-ray radiation, semiconductor sensors, CdTe, CdZnTe, dosimetry, spectrometry, detectors

Abstract

Sensors based on the wide-bandgap semiconductor compound CdZnTe have been investigated. The advantages of such sensors are demonstrated: a wide range of photon flux and energy measurement, high detection efficiency, and satisfactory energy resolution without the need for deep cooling. Devices based on CdZnTe sensors are described, including a dosimeter for dose-rate monitoring and an X-ray spectrometer. The developed detection modules reliably register X-ray radiation starting from energies of 5 keV.

Published
2006-04-30
How to Cite
Rybka, A. V., ZakharchenkoA. А., Davydov, L. N., Shlyakhov, I. N., Blinkin, A. A., & Kutnyi, K. V. (2006). CdZnTe-based sensors for X-ray radiation measurements. Technology and Design in Electronic Equipment, (2), 23-26. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2006.2.23
Issue
No. 2 (2006): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2006 Rybka A. V., Zakharchenko A. A., Davydov L. N., Shlyakhov I. N., Blinkin A. A., Kutnyi K. V.

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.