Evaluation of manufacturing errors in thin-film components

  • V. G. Spirin SPA «Temp-Avia», Arzamas, Russia
Keywords: test circuit, manufacturing systematic and random errors, thin-film components, calculation algorithm

Abstract

A test circuit and calculation algorithms have been developed to determine systematic and random errors in the design parameters of a thin-film resistor. An experimental evaluation of these errors has been conducted. Formulas for calculating the dimensions of conductors and contact pads are provided.

Published
2004-08-30
How to Cite
Spirin, V. G. (2004). Evaluation of manufacturing errors in thin-film components. Technology and Design in Electronic Equipment, (4), 50-53. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.4.50
Issue
No. 4 (2004): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2004 V. G. Spirin

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