Mathematical and software support for studying the electrical conductivity of thick-film resistors

Abstract

A brief description of a modeling software package designed to study effective electrical conductivity within the framework of percolation theory is presented. The core of the package consists of a microstructure modeling block, blocks for numerical estimation of model parameters, and a block of algorithms and programs for finding the percolation threshold, critical index, and concentration dependence. The software package can be used in the manufacturing of thick-film hybrid integrated microcircuits.