Сonnecting MEMS device for BGA components functional testing
Abstract
Multiprobe сonnecting device for initial and functional check of electronic components with matrix pin balls has been developed. The device ensures nondefect pneumatic pressing of probes against the terminals.
Published
2012-02-28
How to Cite
Nevlyudov, N. I. S., Martynyak, R. M., Palagin, V. A., Slobodyan, B. S., Razumov-Frizyuk, E. A., Zharikova, I. V., Dmytriv, M. I., & Belyaev, A. S. (2012). Сonnecting MEMS device for BGA components functional testing. Technology and Design in Electronic Equipment, (1), 54-56. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/475
Section
Articles
Copyright (c) 2012 Невлюдов И. Ш., Мартыняк Р. М., Палагин В. А., Слободян Б. С., Разумов-Фризюк Е. А., Жарикова И. В., Дмитрив М. И., Беляев А. С.

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