Сonnecting MEMS device for BGA components functional testing

  • Nevlyudov I. Sh. Nevlyudov Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • R. M. Martynyak Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • V. A. Palagin Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • B. S. Slobodyan Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • E. A. Razumov-Frizyuk Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • I. V. Zharikova Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • M. I. Dmytriv Kharkiv National University of Radio Electronics, Kharkiv, Ukraine
  • A. S. Belyaev Kharkiv National University of Radio Electronics, Kharkiv, Ukraine

Abstract

Multiprobe сonnecting device for initial and functional check of electronic components with matrix pin balls has been developed. The device ensures nondefect pneumatic pressing of probes against the terminals.

Published
2012-02-28
How to Cite
Nevlyudov, N. I. S., Martynyak, R. M., Palagin, V. A., Slobodyan, B. S., Razumov-Frizyuk, E. A., Zharikova, I. V., Dmytriv, M. I., & Belyaev, A. S. (2012). Сonnecting MEMS device for BGA components functional testing. Technology and Design in Electronic Equipment, (1), 54-56. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/475