Increase in sensitivity of sensor units of environment refraction index change based on superficial plasmon resonance

  • Yu. V. Ushenin V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • А. V. Samoylov V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • R. V. Khristosenko V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
Keywords: surface plasmon resonance, determination of the SPR angle, SPR in the IR region

Abstract

Results of computer modelling of an angular spectrum superficial plasmon resonance in metal films measurements with device PLAZMON-5 with infra-red radiator are analysed. It is shown that use of an infra-red source of radiation allows improving sensitivity of sensor device in comparison with source of visible light. On an example of dielectric refraction indexes measurement with PLAZMON-5 devise experimental check of theoretical calculations has been carried out.

Published
2011-04-28
How to Cite
Ushenin, Y. V., SamoylovА. V., & Khristosenko, R. V. (2011). Increase in sensitivity of sensor units of environment refraction index change based on superficial plasmon resonance. Technology and Design in Electronic Equipment, (1–2), 12-14. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2011.1-2.12
Issue
No. 1–2 (2011): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2011 Ushenin Yu. V., Samoylov R. V., Khristosenko R. V.

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This work is licensed under a Creative Commons Attribution 4.0 International License.