Device for non contact measurement of semiconductor conductivity

  • A. A. Ascheulov Institute of Thermoelectricity of the NAS and MES of Ukraine, Chernivtsy, Ukraine
  • I. A. Buchkovskii Yurii Fedkovych Chernivtsi National University, Ukraine
  • I. S. Romanyuk Business Park «Quartz», Chernivtsy, Ukraine
Keywords: semiconductor conductivity, inductive sensor, circuit quality factor, electromagnetic field energy absorption

Abstract

Ways of modifying known methods and devices for measuring the conductivity of semiconductor materials are considered. A block diagram of the device is presented, in which a differential measurement method and single‑channel processing of the measuring signal are implemented. The functioning of individual blocks and of the device as a whole is described.

Published
2007-04-30
How to Cite
Ascheulov, A. A., Buchkovskii, I. A., & Romanyuk, I. S. (2007). Device for non contact measurement of semiconductor conductivity. Technology and Design in Electronic Equipment, (2), 55-57. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2007.2.55
Issue
No. 2 (2007): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2007 Ascheulov A. A., Buchkovskii I. A., Romanyuk I. S.

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