Investigation of intrinsic and impurity point defects in sapphire substrates by luminescence methods

  • D. I. Bletskan Uzhgorod National University, Ukraine
  • Ya. M. Pekar Uzhgorod National University, Ukraine
  • A. R. Lukyanchuk Scientific and Production Firm “Tekhnokristall”, Uzhgorod, Ukraine
Keywords: sapphire, luminescence, point defects, impurities

Abstract

This work is devoted to the study of intrinsic and impurity point defects in sapphire substrates and raw materials using luminescence methods. It is proposed to employ luminescence under various types of excitation as a sensitive and informative rapid technique for detecting intrinsic and impurity point defects in sapphire crystals and substrates.

Published
2006-06-30
How to Cite
Bletskan, D. I., Pekar, Y. M., & Lukyanchuk, A. R. (2006). Investigation of intrinsic and impurity point defects in sapphire substrates by luminescence methods. Technology and Design in Electronic Equipment, (3), 59-64. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2006.3.59
Issue
No. 3 (2006): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2006 Bletskan D. I., Lukyanchuk A. R., Pekar Ya. M.

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.