Study of the photoelectric properties of the symmetric heterostructure “oxide–InSe–oxide”

  • Z. D. Kovalyuk I. M. Frantsevich Institute for problems of materials science of NAS of Ukraine, Kyiv, Ukraine
  • V. M. Katerynchuk I. M. Frantsevich Institute for problems of materials science of NAS of Ukraine, Kyiv, Ukraine
  • O. N. Sydor I. M. Frantsevich Institute for problems of materials science of NAS of Ukraine, Kyiv, Ukraine
Keywords: InSe, oxide, phototransistor

Abstract

The possibility of fabricating an n–p–n type phototransistor based on a double heterostructure “oxide–InSe–oxide” is demonstrated. Photocurrent amplification in the phototransistor occurs only for initial sample thicknesses comparable to the diffusion length of minority charge carriers. A distinctive feature of the amplification is the transition of the phototransistor from a high-resistance to a low-resistance state at certain voltages and illumination levels. The higher the illumination level, the lower the transition voltage. The current density through the phototransistor during such a transition can reach 60–100 mA/cm².

Published
2005-02-28
How to Cite
Kovalyuk, Z. D., Katerynchuk, V. M., & Sydor, O. N. (2005). Study of the photoelectric properties of the symmetric heterostructure “oxide–InSe–oxide”. Technology and Design in Electronic Equipment, (1), 38-39. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2005.1.38