Khoverko YN. Investigation of the stability of polysilicon layers in SOI-structures under irradiation by electrons and hard magnetic field influence. TKEA [Internet]. 2010Dec.26 [cited 2025Nov.14];(5–6):63-6. Available from: https://www.tkea.com.ua/index.php/journal/article/view/TKEA2010.5-6.63