Vorobyov , G. S., A. A. Drozdenko, Yu. V. Shulga, and I. V. Barsuk. “Method of Middle-Intensive Electron Beams Diagnostics by Means of Transient Radiation”. Technology and design in electronic equipment, no. 5–6 (December 26, 2010): 7-10. Accessed November 14, 2025. https://www.tkea.com.ua/index.php/journal/article/view/TKEA2010.5-6.07.