Perevertailo, V. L. “Determination of Radiation Resistance of Integrated Circuits With the Use of Low-Energy X-Radiation”. Technology and design in electronic equipment, no. 1 (February 28, 2012): 30-34. Accessed November 6, 2025. https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.1.30.