Voitsekhovskii, A. V., S. N. Nesmelov, and N. A. Kulchitskii. “Capacitance Properties of MIS Structures HgCdTe/SiO2/Si3N4”. Technology and design in electronic equipment, no. 4 (August 30, 2005): 35-38. Accessed April 28, 2026. https://www.tkea.com.ua/index.php/journal/article/view/TKEA2005.4.35.