Khoverko, Y. N. “Investigation of the Stability of Polysilicon Layers in SOI-Structures under Irradiation by Electrons and Hard Magnetic Field Influence”. Technology and Design in Electronic Equipment, no. 5–6, Dec. 2010, pp. 63-66, https://www.tkea.com.ua/index.php/journal/article/view/TKEA2010.5-6.63.