Dushkin, S. A., V. B. Ivanskiy, A. M. Kurov, V. A. Odinets, and A. N. Orobinskiy. “The Measurement Errors of X-Ray Devices Features”. Technology and Design in Electronic Equipment, no. 3, June 2011, pp. 44-49, https://www.tkea.com.ua/index.php/journal/article/view/TKEA2011.3.44.