Kazakov, A. I., Andriyanov, A. V., Mironov, V. S. and Polyarush, O. V. (2003) “Calculation of frequency dependence of dielectric characteristics of thin films in the HfO₂—Nd₂O₃ system”, Technology and design in electronic equipment, (1), pp. 52-54. Available at: https://www.tkea.com.ua/index.php/journal/article/view/TKEA2003.1.52 (Accessed: 3July2026).