Popov, V. M., Yu. M. Shustov, A. S. Klimenko, and A. P. Pokanevich. 2009. “The Influence of Low Energy Argon Ion Irradiation on Generation of Electrically Active Defects in Silicon”. Technology and Design in Electronic Equipment, no. 4 (August), 48-51. https://www.tkea.com.ua/index.php/journal/article/view/TKEA2009.4.48.