Method for evaluating the quality of thin-film board

  • V. G Spirin Arzamas Polytechnic Institute (branch) of the NSTU, Russia
Keywords: thin-film resistor, resistance instrumental error

Abstract

A method for estimation of the quality of a thin-film board has been developed, based on the results of resistance measuring and instrumental errors calculation. Recommendations are given for the exclusion of gross errors in the application of the method. The practical estimation carried out shows the high efficiency of the developed algorithms. This method allows increasing the boards yield by 1,5–2 times.

Published
2012-06-25
How to Cite
Spirin, V. G. (2012). Method for evaluating the quality of thin-film board. Technology and Design in Electronic Equipment, (3), 31-34. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.3.31
Issue
No. 3 (2012): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2012 Spirin V. G.

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