The measurement errors of X-ray devices features

  • S. A. Dushkin National Scientific Centre "Institute of Metrology", Kharkiv, Ukraine
  • V. B. Ivanskiy National Scientific Centre "Institute of Metrology", Kharkiv, Ukraine
  • A. M. Kurov S. P. Grigoryev Institute of Medical Radiology, Kharkiv, Ukraine
  • V. A. Odinets National Scientific Centre "Institute of Metrology", Kharkiv, Ukraine
  • A. N. Orobinskiy National Scientific Centre "Institute of Metrology", Kharkiv, Ukraine
Keywords: X-rays, x-ray unit, average energy, homogeneity ratio, half-value layer

Abstract

Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measurement and calculation of features of X-ray installation with requirements to errors of standard X-ray radiation features with narrow spectrum on DSTU ISO 4037-1:2006. Criteria of choosing the additional filters thickness for measurement 1st HVL and 2nd HVL are defined. The errors resulting from calculation of mean photon energy of X-ray radiation and homogeneity coefficient are specified.

Published
2011-06-28
How to Cite
Dushkin, S. A., Ivanskiy, V. B., Kurov, A. M., Odinets, V. A., & Orobinskiy, A. N. (2011). The measurement errors of X-ray devices features. Technology and Design in Electronic Equipment, (3), 44-49. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2011.3.44
Issue
No. 3 (2011): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2011 Dushkin S. A., Ivanskiy V. B., Kurov A. M., Odinets V. A., Orobinskiy A. N.

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This work is licensed under a Creative Commons Attribution 4.0 International License.