Calculation of X‑ray radiation characteristics

  • S. A. Dushkin National Scientific Centre "Institute of Metrology", Kharkiv, Ukraine
  • А. М. Kurov S. P. Grigoryev Institute of Medical Radiology, Kharkiv, Ukraine
  • V. A. Odinets National Scientific Centre "Institute of Metrology", Kharkiv, Ukraine
  • A. N. Orobinskiy National Scientific Centre "Institute of Metrology", Kharkiv, Ukraine
Keywords: X-ray radiation, spectral resolution, mean photon energy, homogeneity coefficien, half-value layer

Abstract

An algorithm has been developed that makes it possible to calculate the characteristics of X‑ray radiation: spectral resolution, mean energy, homogeneity coefficient, first and second half‑value layers. Analysis and comparison of the calculated characteristics of standard X‑ray radiation series L, N, W, and H with the corresponding characteristics given in DSTU ISO 4037‑1:2006 have been carried out. Based on the analysis and comparison, the applicability criterion of the algorithm has been determined — the value of the homogeneity coefficient.

Published
2008-12-30
How to Cite
Dushkin, S. A., KurovА. М., Odinets, V. A., & Orobinskiy, A. N. (2008). Calculation of X‑ray radiation characteristics. Technology and Design in Electronic Equipment, (6), 60-64. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2008.6.60
Issue
No. 6 (2008): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2008 Dushkin S. A., Kurov A. M., Odinets V. A., Orobinskiy A. N.

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