Rapid method for quality control of semiconductor diode crystals

  • S. P. Pavljuk Taras Shevchenko National University of Kyiv, Ukraine
  • L. V. Ishchuk E. O. Paton electric welding institute of NAS of Ukraine, Kyiv, Ukraine
  • V. M. Kislitsyn E. O. Paton electric welding institute of NAS of Ukraine, Kyiv, Ukraine
Keywords: thermal field, diode, diagnostics, recombination

Abstract

The feasibility of using infrared radiation from semiconductors for rapid diagnostics of the quality of semiconductor diode crystals is demonstrated. A method has been developed to separate the recombination and thermal components of the radiation emitted by a heated diode crystal. The possibility of selecting a diode crystal soldering mode, under which it heats up uniformly, based on its radiation, is demonstrated.

Published
2004-06-30
How to Cite
Pavljuk, S. P., Ishchuk, L. V., & Kislitsyn, V. M. (2004). Rapid method for quality control of semiconductor diode crystals. Technology and Design in Electronic Equipment, (3), 62-64. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.3.62
Issue
No. 3 (2004): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2004 Pavljuk S. P., Ishchuk L. V., Kislitsyn V. M.

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