Stability of characteristics of copper film resistance thermotransducers

  • V. V. Brailovskyi Yurii Fedkovych Chernivtsi National University, Ukraine
  • O. E. Ilarionov Yurii Fedkovych Chernivtsi National University, Ukraine
  • P. M. Shpatar Yurii Fedkovych Chernivtsi National University, Ukraine
Keywords: resistance thermotransducer, short-term stability, long-term stability, thermal cycle, temperature hysteresis

Abstract

Studies were carried out on the short-term and long-term stability of the characteristics of copper film resistance thermotransducers. A batch of thermotransducers was tested under thermal cycling from –196 °C to +200 °C; the change in resistance R0 did not exceed 1.1 Ω. Over four years of storage, the change in R0 of the copper film resistance thermotransducers did not exceed 0.05 Ω. The results indicate a linear temperature dependence of the sensor resistance in the range from –50 °C to +200 °C.

Published
2004-02-29
How to Cite
Brailovskyi, V. V., Ilarionov, O. E., & Shpatar, P. M. (2004). Stability of characteristics of copper film resistance thermotransducers. Technology and Design in Electronic Equipment, (1), 56-58. Retrieved from https://www.tkea.com.ua/index.php/journal/article/view/TKEA2004.1.56
Issue
No. 1 (2004): Tekhnologiya i konstruirovanie v elektronnoi apparature
Section
Articles

Copyright (c) 2004 V. V. Brailovskyi, O. E. Ilarionov, P. M. Shpatar

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