Yermolenko YO, Bondarenko OF, Baranov OM. Thermal mathematical model of semiconductor devices for measurement of current-voltage characteristics by pulse method. TKEA [Internet]. 2012Oct.23 [cited 2025Sep.16];(5):14-8. Available from: http://www.tkea.com.ua/index.php/journal/article/view/TKEA2012.5.14