Gritcov, S. S., G. F. Sorokin, and T. V. Shestacova. “Pseudo-Ring Tests Resolution for Dynamic Single Faults in Word-Oriented Memory”. Technology and design in electronic equipment, no. 5–6 (December 28, 2018): 3-9. Accessed September 16, 2025. http://www.tkea.com.ua/index.php/journal/article/view/TKEA2018.5-6.03.