Modulation polarimetry of full internal reflection, broken by diamond-like films

  • L. S. Maximenko V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • O. N. Mishchuk V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • I. E. Matyash V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • B. K. Serdega V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, Kyiv, Ukraine
  • E. G. Kostin Institute for Nuclear Research of NASU, Kyiv, Ukraine
  • B. P. Polozov Institute for Nuclear Research of NASU, Kyiv, Ukraine
  • O. A. Fedorovich Institute for Nuclear Research of NASU, Kyiv, Ukraine
  • G. K. Savinkov STC «Kripton», Kyiv, Ukraine
Keywords: spectroscopic measurements, solid state detector spectrometer systema, modular spectrometer

Abstract

This article presents research results on diamond-like films produced under different technological conditions. The parameter ρ — polarization difference — has been introduced. It has been found from spectral features of the parameter ρ that the interaction of electromagnetic radiation with the electronic system of specimens, which occurs in the used spectral range, consists of local and polariton surface resonances, differing in frequencies and times of relaxations. The authors concluded that the correlation in resonance intensity is defined by the structural characteristics of the specimens. These results show that modulation polarimetry is a perspective technique for diagnostics of the structural homogeneity of composite nanocluster films.

Published
2013-02-18
How to Cite
Maximenko, L. S., Mishchuk, O. N., Matyash, I. E., Serdega, B. K., Kostin, E. G., Polozov, B. P., Fedorovich, O. A., & Savinkov, G. K. (2013). Modulation polarimetry of full internal reflection, broken by diamond-like films. Technology and Design in Electronic Equipment, (1), 3-8. Retrieved from http://www.tkea.com.ua/index.php/journal/article/view/TKEA2013.1.03